Generic interface test adapter

A generic interface test adaptor for configuring the coupling between a test station and a variety of line replaceable units and a variety of shop replaceable units under test, the generic interface test adaptor comprising:

• a first connector for coupling a predetermined line replaceable unit with the generic interface test adaptor;
• an interface plane having a first surface, a first field of contact pins, and a second field of contact pins, wherein a first end of the first field of contact pins and a first end of the second field of contact pins extend from the first surface, the second end of the first field of contact pins for coupling to the test station, and a second end of the second field of contact pins for coupling to the first connector;
• an interface frame for housing the interface plane, the first connector attached to the interface frame;
• a first interface card for configuring the generic interface test adaptor to test the predetermined line replaceable unit, the first interface card having,
• a second surface configured to couple with the first surface,
• a first field of contact pads and a second field of contact pads arranged on the second surface such that, when the second surface is brought into mating alignment with the first surface, electrical contact is established between the first end of the first field of contact pins and the first field of contact pads and between the first end of the second field of contact pins and the second field of contact pads, and
• a first set of conductive traces for coupling the first field of contact pads to the second field of contact pads, the first set of conductive traces arranged according to the predetermined line replaceable unit under test such that electrical coupling is made between the test station and the predetermined line replaceable unit;
• and
• a second interface card for configuring the generic interface test adaptor to test a predetermined shop replaceable unit, the second interface card having,
• a third surface configured to couple with the first surface,
• a fourth surface opposite the third surface,
• a third field of contact pads arranged on the third surface such that, when the third surface is brought into mating alignment with the first surface, electrical contact is established between the first end of the first field of contact pins and the third field of contact pads, and
• at least one second connector, arranged on the fourth surface, for coupling the predetermined shop replaceable unit with the generic interface test adaptor, and
• a second set of conductive traces for coupling the third field of contact pads to the at least one second connector, the second set of conductive traces configured according to the predetermined shop replaceable unit under test such that electrical coupling is made between the test station and the predetermined shop replaceable unit.