US 5,710,934 AGranted

Methods and test platforms for developing an application-specific integrated circuit

AssigneeSGS-Thomson Microelectronics S.A.

InventorsMariano Bona, Pierre-Albert Comte, Duc Pham-Minh

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Abstract

Methods and test platforms for developing an application-specific integrated circuit incorporating, on the same chip, a signal processor core, RAM memory and ROM memory intended to receive a management program and processing program, and input-output management peripherals specific to the application. The signal processor, RAM memory and ROM memory correspond respectively to existing separate IC components. The processing program is developed and tested on a test platform including at least these separate IC components together with a core-emulation integrated circuit, which includes the signal processor core in a minimal configuration. An interface program and diagnostic interface logic allows the platform to be controlled from a microcomputer, which can thereby implement automatic chaining of tests.

Claims34

Dependent claims

A method for developing a programmed ASIC integrated circuit which includes a signal processor core, a RAM memory and a ROM memory for management and processing programs, and input-output management peripherals, and which performs command exchanges with external devices, said method comprising the steps of:

(a) providing a core-emulation integrated circuit, which includes said signal processor core but does not include all other elements of said ASIC;
(b) mounting said core-emulation integrated circuit on a first test platform circuit board which also includes one or more additional integrated circuits connected to emulate said RAM and ROM to said core-emulation integrated circuit, at least one data register for passing data between said core-emulation integrated circuit and said first additional integrated circuits, an analog/digital converter for sending and receiving analog data, and also includes diagnostic logic connected to provide monitoring and program loading by a microcomputer;
(c) testing and debugging said first test platform, using testing and debugging features which are included in the processing programs and which can be activated by a subset of the application commands in both the final version of the integrated circuit and in any production versions, to provide initial debugging of one or more signal processing programs, but not the management programs, for use in a finished ASIC design;
and
(d) manufacturing integrated circuits incorporating said signal processor core, and RAM and ROM memories containing signal processing programs debugged in accordance with said step (c), and also containing management programs.

2 more elements

(a) providing a core-emulation integrated circuit, which includes said signal processor core but does not include all other elements of said ASIC;
(b) mounting said core-emulation integrated circuit on a first test platform circuit board which also includes one or more additional integrated circuits connected to emulate said RAM and ROM to said core-emulation integrated circuit, at least one data register for passing data between said core-emulation integrated circuit and said first additional integrated circuits, an analog/digital converter for sending and receiving analog data, and also includes diagnostic logic connected to provide monitoring and program loading by a microcomputer;
(c) providing an interface program which allows said platform to be controlled, for automatic chaining of tests, from a microcomputer
(d) testing and debugging said first test platform, using testing and debugging features which are included in the processing programs and which can be activated by a subset of the application commands in both the final version of the integrated circuit and in any production versions, to provide initial debugging of one or more signal processing programs, but not the management programs, for use in a finished ASIC design;
and
(e) manufacturing integrated circuits incorporating said signal processor core, and RAM and ROM memories containing signal processing programs debugged in accordance with said step (c), and also containing management programs.

3 more elements

(a) providing a core-emulation integrated circuit, which includes said signal processor core but does not include all other elements of said ASIC;
(b) mounting said core-emulation integrated circuit on a first test platform circuit board which also includes one or more additional integrated circuits connected to emulate said RAM and ROM to said core-emulation integrated circuit, at least one data register for passing data between said core-emulation integrated circuit and said first additional integrated circuits, an analog/digital converter for sending and receiving analog data, and also includes diagnostic logic connected to provide monitoring and program loading by a microcomputer;
(c) passing data between said core-emulation integrated circuit and said first test platform circuit board via at least one FIFO register
(d) testing and debugging said first test platform, using testing and debugging features which are included in the processing programs and which can be activated by a subset of the application commands in both the final version of the integrated circuit and in any production versions, to provide initial debugging of one or more signal processing programs, but not the management programs, for use in a finished ASIC design;
and
(e) manufacturing integrated circuits incorporating said signal processor core, and RAM and ROM memories containing signal processing programs debugged in accordance with said step (c), and also containing management programs.

3 more elements

Dependencies are inferred from the claim text.