Non-volatile memory in power and linear integrated circuits
AssigneeTexas Instruments Incorporated
InventorsRoss E. Teggatz, Joseph A. Devore, Stephen L. Sutton, Ganapathy R. Subramaniam
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AssigneeTexas Instruments Incorporated
InventorsRoss E. Teggatz, Joseph A. Devore, Stephen L. Sutton, Ganapathy R. Subramaniam
Estimating the term…
A testable temperature warning circuit (120) in an integrated circuit substrate (124) provides a warning if the substrate temperature exceeds a critical temperature. A programming circuit (140) controls a selection, circuit (128) to establish a programmably selectable temperature at either the critical temperature or a second predetermined temperature lower than the critical temperature to enable the warning circuit operation to be tested at a temperature lower than the critical temperature. In one embodiment, the selection circuit 128 comprises a current source that produces a voltage drop across the resistor 121 and base-emitter of the transistor 122 produces a substrate temperature indicating current of magnitude related to the temperature of the substrate. The substrate temperature indicating current at the second temperature is extrapolatingly related to the substrate temperature indicating current at the critical temperature. A method is also presented for testing a temperature warning circuit fabricated in an integrated circuit substrate.
A temperature warning circuit for testing an integrated circuit without damaging the integrated circuit, comprising:
A circuit for testing for a temperature of an integrated circuit substrate, fabricated in said substrate and comprising:
A testable warning circuit fabricated in an integrated circuit substrate for providing a warning if a temperature of said substrate exceeds a critical temperature, comprising:
A method for operating a temperature warning circuit fabricated in an integrated circuit substrate, said warning circuit being intended to produce a warning if a temperature of said substrate exceeds a critical temperature, comprising:
Dependencies are inferred from the claim text.