Outdoor scene simulating apparatus for testing an infrared imaging device

An apparatus for testing an infrared imaging device which is sensitive to electromagnetic radiation in a three micron to twelve micron wavelength band, said apparatus comprising:

• a flat plate blackbody for generating and emitting infrared energy along a first optical path, said infrared energy having a wavelength in a range of between about three microns and about twelve microns;
• said flat plate blackbody comprising a thirty centimeter flat plate blackbody;
• a metallic substrate positioned downstream from said blackbody on said first optical path, said metallic substrate having a front surface and a rear surface, the front surface of said metallic substrate having a portion thereof coated with an infrared absorbing black ink to simulate thermal emissions from an outdoor scene, the front surface of said metallic substrate reflecting a substantial portion of said infrared energy incident upon the front surface of said metallic substrate, the front surface of said metallic substrate providing a reflecting rate greater than 0.85;
• said infrared absorbing black ink having a density which varies across the front surface of said metallic substrate;
• said metallic substrate being fabricated from aluminum sheet having a thickness of approximately 0.5 millimeters;
• a thermal mass positioned at the rear surface of said metallic substrate, said thermal mass abutting the rear surface of said metallic substrate to cool said metallic substrate;
• said thermal mass comprising an aluminum plate set to a temperature of approximately twenty degrees centigrade;
• and
• a collimator positioned on a second optical path downstream from said metallic substrate, said collimator collecting said infrared energy reflected from the front surface of said metallic substrate, said collimator forming a collimated beam of infrared energy from said infrared energy collected by said collimator, said collimator directing said collimated beam of infrared energy along a third optical path to said infrared imaging device being tested.