Structure to utilize a partially functional cache memory by invalidation of faulty cache memory locations
AssigneeSGS-Thomson Microelectronics S.A.
InventorDavid Charles McClure
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AssigneeSGS-Thomson Microelectronics S.A.
InventorDavid Charles McClure
Estimating the term…
According to the present invention, when faulty data bits in a cache memory are not repairable through conventional repair means such as row/column redundancy, the faulty bits are made inaccessible to the microprocessor by rendering invalid an appropriate line of data in the cache memory containing the faulty data. The present invention employs address detection circuitry which detects when a faulty data address stored in the tag RAM is presented during a microprocessor memory cycle and forces the valid bit for that faulty data to a predetermined logic level. When the valid bit associated with the faulty data is set to the predetermined logic level, the tag RAM generates a signal indicative of a "miss" condition. The "miss condition" is communicated to the microprocessor which must access the requested data from main memory, thus effectively bypassing the faulty data. The address detection circuitry of the invalidation circuitry may be expanded to handle any number of faulty data. In this way, a primary or secondary cache memory having faulty data may be utilized.
Circuitry for invalidating faulty data locations in a cache memory, comprising:
A method for invalidating and bypassing faulty data locations in a cache memory, comprising the steps of:
Dependencies are inferred from the claim text.