Measurement system for chromium content in chromized layers and the like
AssigneeThe Babcock & Wilcox Company
InventorsDennis Connolly, Walter R. Mohn, Bart A. Stuchell
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Abstract
A method and apparatus for measuring a target analyte diffused in a wall of a metal member provides a sample of the metal member which is cut to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample. An x-ray analyzing system having an analyzing slot is moved past the sample between the first and second points. Data from the x-ray analyzing system during the translation of the sample is collected to analyze the analyte content.
Claims12
A method for measuring a target analyte diffused in a wall of a metal member, comprising:
- providing a sample of the metal member;
- cutting a surface of the sample to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample;
- providing an x-ray analyzing system having an analyzing slot;
- translating the sample between the first and second points, and past the slot;
- and
- accumulating data from the x-ray analyzing system during the translation of the sample.
A system for measuring a target analyte diffused in a wall of a metal member, comprising:
- a sample of the metal member which has a surface with a wall thickness that has been cut down from zero at a first point on the sample, to a selected depth at a second point on the sample;
- an x-ray analyzing system having an analyzing slot;
- and
- means for translating the sample between the first and second points and past the slot for accumulating data from the x-ray analyzing system during the translation of the sample.
Dependencies are inferred from the claim text.