Power amplification circuit
AssigneeMatsushita Electronics Corporation
InventorsHidetoshi Furukawa, Daisuke Ueda
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AssigneeMatsushita Electronics Corporation
InventorsHidetoshi Furukawa, Daisuke Ueda
Estimating the term…
Variations in the waveform of high-frequency signals amplified by a field-effect transistor (FET) in a power amplification circuit due to changes in temperature are reduced. A FET having an n-type active layer, a source electrode, a drain electrode and a gate electrode is formed on a (1 0 0)-crystal plane of a semi-insulating GaAs substrate. The FET is protected by a passivation film. The angle .theta., formed between the longitudinal axial direction of the gate electrode and the <0 -1 -1>-direction, is set at an angle of from 0.degree. to 90.degree. corresponding to the impurity concentration of the n-type active layer, in order that the temperature coefficient of the FET threshold voltage becomes substantially equal to the temperature coefficient of the gate bias voltage applied from a power supply to the gate electrode. If the angle .theta. is set at 45.degree., then the temperature coefficient of the FET threshold voltage becomes zero.
A power amplification circuit comprising a field-effect transistor for amplifying the power of an in, high-frequency signal and a voltage generation circuit for generating a gate bias voltage to said field-effect transistor,
A power amplification circuit comprising a field-effect transistor for amplifying the power of an input high-frequency signal and an input matching circuit connected between a signal source and said field-effect transistor,
Dependencies are inferred from the claim text.