Method of finding DC test point of an integrated circuit

A method of finding a DC test point of an integrated circuit to be used during testing of the integrated circuit, said circuit including a plurality of input and output terminals identified by respective terminal names, comprising steps of:

• displaying a list of all the input and output terminals of said circuit, said list including the respective terminal names of all the input and output terminals;
• inputting selected terminals among the input and output terminals of the displayed list;
• inputting a selected test pattern file among a number of stored test pattern files, each stored test pattern file including a plurality of sequentially occurred test vectors and identified by a name of the test pattern file, and said test vectors identified by respective vector numbers;
• inputting a test point finding condition related to the DC test point, the test point finding condition indicating a desired state of an output terminal for a given test vector;
• finding the DC test point of said circuit for the selected terminals by using the test vectors of the selected test pattern file and the test point finding condition;
• and
• inserting test point data of said found DC test point into the displayed list so that the resulting list including said test point data is displayed.