Word line decoding circuit of a semiconductor memory device
AssigneeSamsung Electronics Co., Ltd.
InventorHyeun-Su Kim
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AssigneeSamsung Electronics Co., Ltd.
InventorHyeun-Su Kim
Estimating the term…
The present invention includes a plurality of memory cells store information and one row decoder for every four word lines to decode an external address output a single row decoding signal. A word drive decoder generates a word line driving signal. A split word line driver arranged such that the memory cell array is formed between each split word line driver, inputs the single row decoding signal output from the row decoder and the word line driving signal output from the word drive decoder to thereby output a word line signal to select appropriate memory cells. With this structure, the reduced number of metalized lines requiring straps which overlay the memory cell array help minimize short-circuit problems that would otherwise occur when dimensions of metalized lines are reduced.
A word line decoding circuit of an integrated semiconductor memory device including a plurality of memory cells for storing information, said word line decoding circuit comprising:
A word line decoding circuit of an integrated semiconductor memory device including a plurality of memory cells for storing information, said word line decoding circuit comprising:
A word line decoding circuit of an integrated semiconductor memory device including a plurality of memory cells for storing information, said word line decoding circuit comprising:
A word line decoding circuit of an integrated semiconductor memory device including a plurality of memory cells formed in a memory cell area, a first strap area adjacent one side of said memory cell area, and a second strap area adjacent a side opposite said one side of said memory cell area, said word line decoding circuit comprising:
Dependencies are inferred from the claim text.