Precise shear-stress measurement apparatus
AssigneeJapan Science and Technology Corporation
InventorKazue Kurihara
Life of this patent
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Abstract
A precise shear-stress measurement apparatus includes a spring disposed perpendicularly to a sample surface, and a cylindrical piezoelectric element disposed perpendicularly to the sample surface and connected to the spring. The piezoelectric element is circumferentially divided into a plurality of pieces. The apparatus further includes a circuit for driving the piezoelectric element, a capacitance-type displacement gauge for detecting a horizontal displacement of the spring, and a battery for driving the displacement gauge. This reduces noise from an electric system, thereby making it possible to precisely measure even rheology motion in a very small space on the order of nanometers.
Claims9
A precise shear-stress measurement apparatus comprising:
- (a) a spring disposed perpendicularly to a sample surface;
- (b) a cylindrical piezoelectric element disposed perpendicularly to said sample surface and connected to said spring, said piezoelectric element being circumferentially divided into a plurality of pieces;
- (c) means for driving said piezoelectric element;
- (d) a capacitance-type displacement gauge for detecting a horizontal displacement of said spring;
- and
- (e) a battery for driving said displacement gauge.
A precise shear-stress measurement apparatus comprising a spring disposed perpendicularly to a sample surface;
- a cylindrical piezoelectric element disposed perpendicularly to said sample surface and connected to said spring, said piezoelectric element being circumferentially divided into a plurality of pieces;
- means for driving said piezoelectric element;
- and a capacitance-type displacement gauge for detecting a horizontal displacement of said spring, wherein said measurement apparatus is assembled as an exchangeable unit.
Dependencies are inferred from the claim text.