Method and structure for generating a boosted word line voltage and a back bias voltage for a memory array
AssigneeMonolithic System Technology, Inc.
InventorsWingyu Leung, Jeffrey J. Lin
Life of this patent
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AssigneeMonolithic System Technology, Inc.
InventorsWingyu Leung, Jeffrey J. Lin
Estimating the term…
A method and structure for generating a boosted word line voltage for a memory array, such as a DRAM array. To ensure that an adequate voltage is applied to the word line of the memory array during write operations, the word line driver circuit is connected to a boost voltage generator which provides a substantially constant, regulated voltage which is boosted to a level which is approximately equal to the V.sub.CC supply voltage plus the threshold voltage of the memory cell pass transistor. A bias voltage generator provides a negative voltage which is used to bias the substrate of the memory array. The boosted voltage generator and the bias voltage generator can be operated in response to the same clock signal used to operate the memory array. A latch-up prevention circuit is provided to ensure that the word line driver circuit does not latch-up during power-on before an adequate boost voltage has been established.
A semiconductor memory fabricated on a substrate, the memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the memory comprising:
A semiconductor memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the memory comprising:
A semiconductor memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the memory comprising:
A semiconductor memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the memory comprising:
A semiconductor memory fabricated on a substrate, the memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the memory comprising:
A method of operating a semiconductor memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the method comprising the steps of:
A method of operating a semiconductor memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the method comprising the steps of:
A method of operating a semiconductor memory fabricated on a substrate, the memory having a word line, a first voltage supply for providing a first supply voltage, and a second voltage supply for providing a second supply voltage, the first supply voltage being greater than the second supply voltage, the method comprising the steps of:
Dependencies are inferred from the claim text.