Method and apparatus for controlling the oscillatory motion of a test device
AssigneeCaterpillar Inc.
InventorTien D. Doan
Life of this patent
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AssigneeCaterpillar Inc.
InventorTien D. Doan
Estimating the term…
A method and apparatus for controlling the oscillatory motion of a test device by using amplitude and DC offset feedback for control purposes. The force applied to the test device is monitored by a load sensor and compared to a preset desired amplitude load setpoint to determine the positive peak amplitude of a sinusoidal control signal. The DC offset feedback is monitored by sampling the value of a displacement feedback signal a number of times for each cycle of movement. The values of the samples are averaged to determine a calculated DC offset. The calculated DC offset is compared to a desired DC offset, which is determined from a preset desired displacement setpoint. The difference between the calculated DC offset and the desired DC offset is then used to control the load applied to the test device to maintain the desired oscillatory movement.
An apparatus for controlling the oscillatory motion of a device under test, the device having a first end and a second end, and being mounted in a test fixture, comprising:
A method for controlling the oscillatory motion of a device under test, including the steps of:
A method, as set forth in claim wherein determining said new set of values includes the steps of:
An apparatus for controlling the oscillatory motion of a device under test, the device having a first end and a second end, and being mounted in a test fixture, comprising:
Dependencies are inferred from the claim text.