Method for forming charge storage electrodes of semiconductor device
AssigneeHyundai Electronics Industries Co., Ltd.
InventorJeong Kim
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AssigneeHyundai Electronics Industries Co., Ltd.
InventorJeong Kim
Estimating the term…
A method for forming charge storage electrodes, involving the steps of patterning a first polysilicon layer in contact with a semiconductor substrate through charge storage electrode contact holes by use of a charge storage electrode mask, selectively growing an oxide film over a portion of interlayer insulating film exposed after the patterning such that the selectively-grown oxide film is upwardly protruded beyond the upper surface of the charge storage electrode mask, removing the charge storage electrode mask, forming a second polysilicon layer over the resulting structure, patterning the second polysilicon layer such that the second polysilicon layer has portions separated from one another, thereby forming charge storage electrodes each constituted by the pattern of the first polysilicon layer in contact with the semiconductor substrate through each corresponding charge storage electrode contact hole and the pattern of the second polysilicon layer disposed over the first polysilicon layer pattern while being in contact with the first polysilicon layer pattern, the second polysilicon layer pattern having bent portions. In accordance with the present invention, therefore, it is possible to obtain an increased surface area and to achieve improvements in yield and reliability of operation.
A method for forming charge storage electrodes of a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.