Semiconductor device
AssigneeNippondenso Co., Ltd.
InventorsHiroshi Maeda, Susumu Ueda, Hiroshi Fujimoto, Yoshiaki Nakayama
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AssigneeNippondenso Co., Ltd.
InventorsHiroshi Maeda, Susumu Ueda, Hiroshi Fujimoto, Yoshiaki Nakayama
Estimating the term…
The resistance to electromigration in a double-layer Al wiring structure of lateral DMOS or the like is improved by further reducing ON resistance and mitigating current concentration. The first-layer source wiring and the first-layer drain wiring which are electrically connected to a plurality of source cells and drain cells respectively are formed into a pectinate pattern respectively. The second-layer source wiring and the second-layer drain wiring are also formed into a pectinate pattern respectively and disposed in inclination at 45 degrees to the patterns of the first-layer source wiring and first-layer drain wiring. At the intersections of the first-layer source wiring and the second-layer source wiring, at the intersections of the first-layer drain wiring and the second-layer drain wiring, at the outer circumferential portions of the pectinate patterns of first-layer source and drain wirings and at the source and drain pads, contact holes are provided on a layer insulation film to make a contact between the first-layer source and drain wirings and the second-layer source and drain wirings, respectively.
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.