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US 5,672,464 AGranted
Method and apparatus for patterning an imaging member
AssigneeTexas Instruments Incorporated
InventorWilliam E. Nelson
Life of this patent
Estimating the term…
Abstract
A device for patterning an imaging member (46) is provided. The device comprises a light source (24) which emits light rays (26). Light rays (26) pass through a collimator lens (28) to collimate the light rays (30). The light then strikes a spatial light modulator (32) which is controlled by a computer (40) to reflect the light (42). The light passes through an imaging lens (44) to magnify the pattern for striking imaging member (46). Imaging member (46) is thus patterned by changing modulator (32) by computer (40).
Claims5
A method of processing data comprising:
- a. loading a line of data into a first row of modulator elements of a two-dimensional array of spatial light modulator elements;
- b. impinging a light beam on said two-dimensional array of spatial light modulator elements wherein said two-dimensional array of spatial light modulator elements selectively modulates at least a portion of said light beam in response to said line of data loaded into said two-dimensional array of spatial light elements;
- c. passing said line of data in parallel through said two-dimensional array of spatial light modulator elements to an adjacent row of modulator elements in said two-dimensional array of spatial light modulator elements;
- d. moving an imaging member past said two-dimensional array of spatial light modulator elements such that said portion of said modulated light beam impinges upon said imaging member;
- and
- e. synchronizing said passing of said line of data with said moving of said imaging member to cause said portion of said modulated light beam to impinge on a fixed area of said imaging member for an extended period of time.
3 more elements
Dependencies are inferred from the claim text.