Method of forming metal contact holes in semiconductor fabrication
AssigneeWinbond Electronics Corp.
InventorsYu-Chung Tien, Chieh-Lin Huang
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AssigneeWinbond Electronics Corp.
InventorsYu-Chung Tien, Chieh-Lin Huang
Estimating the term…
A method of forming metal contact holes during semiconductor fabrication. The method includes three major steps to form the metal contact holes; a wet isotropic etching process for forming a first recess portion, a dry isotropic etching process for extending the first recess portion into a second recess portion, and a dry anisotropic etching process for forming a third recess portion beneath the second recess portion. The second recess portion and the third recess portion in combination constitute the metal contact hole. The lateral extent of the second recess portion, which in part affects subsequent deposition of metal in the contact hole and thus the step coverage effect of the metal connection, can be controlled by limiting the time of the dry isotropic etching process.
A method for forming at least a metal contact hole through at least a dielectric layer on a substrate, comprising the steps of:
A method for forming at least a metal contact hole through at least a dielectric layer on a substrate, comprising the steps of:
A method for forming at least a metal contact hole through at least an oxide layer on a substrate, comprising the steps of:
Dependencies are inferred from the claim text.