Non-contact inspection system
AssigneeMectron Engineering Company, Inc.
InventorJames L. Hanna
Life of this patent
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AssigneeMectron Engineering Company, Inc.
InventorJames L. Hanna
Estimating the term…
An improved non-contact inspection system capable of evaluating spatial form parameters of a workpiece to provide 100% inspection of parts in production. The system causes parts to be sequentially loaded onto an incline track where they pass through a test section. The test section includes a length detection array for measuring the length of the workpiece, which includes a source generating a sheet of light oriented in the longitudinal direction of the workpiece. The profile of the parts are evaluated by one or more light sources also creating a sheet of light oriented transverse to the longitudinal axis of the parts. First and second pairs of single channel photodetectors are provided for each of the light sources which provides a pair of analog outputs of the extent to which each sheet of light is occluded by the part, as well as an ability to eliminate noise or scintillation caused by a point source of light, for example with a laser light source. These outputs are analyzed through appropriate signal processing hardware and software to generate length and profile data related to the workpiece geometry.
An inspection system for evaluating workpieces for conformance to configuration criteria, comprising:
An inspection system for evaluating workpieces for conformance to configuration criteria, comprising:
Dependencies are inferred from the claim text.