Automatic optical pick and place calibration and capability analysis system for assembly of components onto printed circuit boards
AssigneeMicron Electronics, Inc.
InventorGlenn P. Woodhouse
Life of this patent
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AssigneeMicron Electronics, Inc.
InventorGlenn P. Woodhouse
Estimating the term…
A method and apparatus for calibrating and performing statistical capability analysis of a pick-and-place machine comprise loading a glass fiducial plate onto a workholder of a pick-and-place machine, loading a glass slide onto a part placement nozzle of the pick-and-place machine, and placing the glass slide onto the plate. Alignment of a chrome fiducial on the fiducial plate with a chrome target window on the slide is examined. Responsive to the alignment of the target and the fiducial, key calibration codes in calibration software of the pick-and-place machine are adjusted. Once calibration is complete, multiple placement cycles using the glass fiducial plate and glass slides are performed to determine the statistical placement capability of the pick-and-plate equipment.
An apparatus for calibrating rotational alignment of pick-and-place equipment, comprising:
A method for calibrating a pick-and-place machine, comprising the following steps:
A method for calibrating a pick-and-place machine comprising the following steps:
Dependencies are inferred from the claim text.