Apparatus for characterizing an optic
AssigneeHughes Aircraft Company
InventorSandeep Dave
Life of this patent
Estimating the term…
Abstract
An apparatus (10) for characterizing an optic (14) includes a light source (20) adapted to direct a light beam into an optic (14) such that total internal reflection of the light beam occurs. A light detector (38) is disposed to detect light exiting the optic (14). The apparatus (10) also includes a reservoir for holding and dispensing an index of refraction matching fluid between the optic (14) and the light detector (38) to enable light to exit the optic (14) toward the light detector (38) such that the material of the optic (14) is characterized rather than merely the surface thereof.
Claims19
An apparatus for characterizing an optic in-situ, comprising:
- means for introducing a light beam into an optic to be characterized through a surface thereof such that said light beam is totally internally reflected within said optic;
- means for detecting light exiting through said surface of said optic, said means for detecting light outputting a signal related to the intensity of said light detected;
- and
- means for comparing said signal with a known signal level indicative of a standard optic such that the integrity of the entire material of said optic is characterized.
An apparatus for characterizing an optic in-situ comprising:
- a base member;
- a light source connected to said base member and disposed proximate said optic for injecting light in said optic through a surface thereof;
- a light detector connected to said base member and disposed proximate said optic for receiving light from said optic through said surface thereof to provide a detected signal related to the intensity of light detected;
- means for dispensing an index of refraction matching fluid between said light source and said optic and said light detector and said optic;
- and
- a microprocessor for controlling said light detector, said light source, and said dispensing means and for processing said detected signal to provide a characterization of the integrity of the entire material of said optic.
Dependencies are inferred from the claim text.