Particle contamination apparatus for semiconductor wafer processing
AssigneeUnited Microelectronics Corp.
InventorPing I. Chen
Life of this patent
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Abstract
A semiconductor wafer processing system is disclosed which reduces particle accumulations in the wafer loading chamber during the pump down and vent cycle. A separate venting tube is provided which is positioned within the roughing tube used for the pump-down cycle. The venting tube is isolated from particulate matter which may be present in the roughing tube so that venting gas flow does not cause re-entry of the residual particulate matter into the loading chamber. The venting tube can be easily and inexpensively installed as a particle reduction kit into existing wafer processing systems.
Claims7
A semiconductor wafer processing apparatus comprising:
- a load chamber for loading one or more semiconductor wafers,
- a first tube, connected to said load chamber and branching out to a pump down valve, and to a vent valve, and
- a second tube, positioned within said first tube, such that said second tube connects directly between said vent valve and said load chamber and isolates a fluid flow therein from particulate matter in said first tube.
A method of reducing residual particle accumulation in a load chamber during semiconductor processing, comprising the steps of:
- placing one or more semiconductor wafers in a load chamber,
- pumping down said load chamber through a first tube and pump down valve,
- venting said load chamber through a second tube and vent valve, said second tube being located within said first tube, and being connected directly between said vent valve and said load chamber so that said venting through said second tube is isolated from residual particulate matter in said first tube.
A fluid circuit for evacuating and venting a wafer processing apparatus, comprising:
- a chamber With a single port,
- a first fluid connection between said port and a first valve,
- a second fluid connection between said port and a second valve, and contained within said first fluid connection, said second fluid connection for conveying a fluid flow therein so that it is isolated from particulate matter present in said first fluid connection.
Dependencies are inferred from the claim text.