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US 5,476,750 AGranted
Metal ion reduction in the raw materials and using a Lewis base to control molecular weight of novolak resin to be used in positive photoresists
AssigneeHoechst Celanese Corporation
InventorsM. Dalil Rahman, Ping-Hung Lu, Daniel P. Aubin, Ralph R. Dammel, Dana L. Durham
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Abstract
The present invention provides methods for producing water insoluble, aqueous alkali soluble novolak resins having a very low level of metal ions and a substantially consistent molecular weight. A method is also provided for producing photoresist composition from such novolak resins and for producing semiconductor devices using such photoresist compositions.
Claims7
A method for producing a positive photoresist composition comprising:
- a) washing an acidic ion exchange resin with water, washing said ion exchange resin with a mineral acid solution and thereby reducing the metal ions in the ion exchange resin to less than 500 ppb each;
- b) passing a water/formaldehyde solution through the ion exchange resin and thereby reducing the metal ion level of the solution to less than 500 ppb each;
- c) providing one or more phenolic compounds having a metal ion content of less than 200 ppb each;
- d) providing such admixture with a Lewis base concentration before condensation, of from about 10 to 1000 ppm, condensing the formaldehyde with said one or more phenolic compounds, in the presence of an acid catalyst, and thereby producing a water insoluble, aqueous alkali soluble novolak resin having a desirable and consistent molecular weight, a metal ion level of less than 500 ppb each;
- e) providing an admixture of:
- 1) a photosensitive component in an amount sufficient to photosensitize the photoresist composition, 2) the water insoluble, aqueous alkali soluble novolak resin and 3) a solvent.
3 more elements
Dependencies are inferred from the claim text.