Infrared detector substrate with breakaway test tabs
AssigneeGrumman Aerospace Corporation
InventorWei H. Koh
Life of this patent
Estimating the term…
Abstract
A substrate for attaching infrared detector elements to multi-layer modules has a detector interface member to which the infrared detector elements are attachable and which is attachable to the multi-layer module so as to provide electrical communication between the infrared detector elements and the multi-layer module. At least one removable tab is formed upon the detector interface member and a plurality of probing pads are formed upon each tab. Conductive conduits formed upon each tab extend from the detector interface member to the probing pads so as to facilitate electrical communication between dedicated ones of the infrared detector elements and dedicated ones of the probing pads. The probing pads facilitate electrical testing of individual infrared detector elements.
Claims26
A substrate for attaching infrared detector elements to a multi-layer module, the substrate comprising:
- a) a detector interface member to which the infrared detector elements are attachable and which is attachable to the multi-layer module so as to provide electrical communication between the infrared detector elements and the multi-layer module;
- and
- b) at least one removable tab formed upon said detector interface member to facilitate handling thereof.
An infrared detector subassembly comprising:
- a) a plurality of infrared detector elements configured in an array;
- b) a multi-layer module containing circuitry for processing signals from said infrared detector elements;
- c) a substrate attaching said infrared detector elements to said multi-layer modules, the substrate comprising:
- i) a detector interface member to which the infrared detector elements are attached and which is attached to the multi-layer module so as to provide electrical communication between the infrared detector elements and the multi-layer module;
- ii) at least one tab formed upon said detector interface member;
- iii) a plurality of probing pads formed upon said tab(s);
- and
- iv) conductive conduits formed upon said tab(s) and extending from said detector interface member to said probing pads so as to facilitate electrical communication between dedicated ones of said infrared detector elements and dedicated ones of said probing pads;
- and
- d) wherein said probing pads facilitate electrical testing of individual infrared detector elements.
A method for assembling infrared detector subarrays, said method comprising the steps of:
- a) attaching a plurality of infrared detector elements to a detector interface member, the detector interface member having at least one tab formed thereon and also having conductive conduits formed upon the tab(s) such that the conductive conduits provide electrical communication between the infrared detector elements and probing pads formed upon said tab(s);
- b) attaching the substrate to a multi-layer module;
- and
- c) removing the tab(s) from the detector interface member.
Dependencies are inferred from the claim text.