Semiconductor integrated circuit device with fault detecting function
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsYoshihiro Tanaka, Yoshio Inoue
Life of this patent
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Abstract
A logic function block having an output signal potential sensing function is substituted for each of logic function blocks of which fault conditions cannot be detected on the basis of predetermined input/output signal combinations for determining whether or not the semiconductor integrated circuit device operates correctly. Probe lines and sense lines are connected only to the logic function blocks having output signal potential sensing function. The probe lines are driven from a probe line driver, and a sense line receiver reads out signals on the sense lines. Thus, without reducing fault detecting efficiency, the areas of an active region and a wiring region required for forming a fault detecting arrangement can be reduced.
Claims3
A method for producing an integrated circuit having a fault detection function, comprising the steps of:
- generating a signal pattern for testing functions of the integrated circuit so as to determine an existence of faults therein;
- applying the signal pattern to a fault simulation model of the integrated circuit;
- locating at least one logic block wherein a fault would be undetectable;
- replacing the at least one logic block with an output sensed logic block having a sensing means permitting detection of the fault via external examination of an output signal of the logic blocks;
- and
- fabricating the integrated circuit including the output sensed logic block.
Dependencies are inferred from the claim text.