High efficiency method for performing a chemical vapor deposition utilizing a nonvolatile precursor
AssigneeMicron Semiconductor, Inc.
InventorsDonald L. Westmoreland, Gurtej S. Sandhu
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AssigneeMicron Semiconductor, Inc.
InventorsDonald L. Westmoreland, Gurtej S. Sandhu
Estimating the term…
The invention is a method directed to the use of a nonvolatile precursor, either a solid precursor or a liquid precursor, suitable for chemical vapor deposition (CVD), including liquid source CVD (LSCVD), of a semiconductor film. Using the method of the invention the nonvolatile precursor is dissolved in a solvent. The choice of solvent is typically an inorganic compound that has a moderate to high vapor pressure at room temperature and that can be liquified by a combination of pressure and cooling. The solution thus formed is then transported at an elevated pressure and/or a reduced temperature to the CVD chamber. In CVD the solution evaporates at a higher temperature and a lower pressure upon entry to the CVD chamber, and the nonvolatile precursor, in its gaseous state, along with a gas reactant, produces a product which is deposited as a thin film on a semiconductor wafer. In LSCVD the liquid enters the chamber, contacts the wafer, evaporates, produces a product which is deposited as a thin film on the wafer surface.
A method for performing a chemical vapor deposition of a film on a surface of a wafer, comprising the following steps:
A method for depositing a film on a surface, comprising the following steps:
Dependencies are inferred from the claim text.