Defect inspection system for phase shift masks
AssigneeSharp Kabushiki Kaisha
InventorsMakoto Tanigawa, Hiroki Tabuchi, Hiroyuki Moriwaki, Takayuki Taniguchi
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Abstract
In the system according to the present invention detects defects by projecting illumination light for exposure having a certain wavelength perpendicularly onto a phase shift mask to be examined; picking up, by means of an image acquisition section, two pattern images which are formed from the irradiated light having passed through two neighboring dies on the phase shift mask and image-formed individually through respective magnifying projection optical systems, and superposing the image patterns of two dies through an alignment to compare therebetween.
Claims12
A defect inspection system for phase shift masks comprising:
- a light source for irradiating light perpendicularly onto a surface of a phase shift mask to be examined, the mask having a pair of dies that are identical except for possible flaws;
- a monochromatic light selection means disposed between said light source and the phase shift mask for filtering and separating light having a certain wave length from the light emitted by said light source;
- a pair of projection optical systems each of which forms an image pattern of the irradiated light having passed through a corresponding one of the dies and which projects the formed image pattern;
- means for forming a superposed image of the image patterns formed by the pair of projection optical systems;
- and
- a detection section for detecting defects on the phase shift mask to be examined by processing the superposed image.
A defect inspection system for phase shift masks comprising:
- a light source for irradiating light perpendicularly onto the surface of a phase shift mask to be examined, the mask having a pair of dies that are identical except for possible flaws;
- a monochromatic light selection means disposed between said light source and the phase shift mask for filtering and separating light having a certain wave length from the light emitted by said light source;
- a 180.degree. phase shift means disposed on an optical path of the irradiated light after a first of the pair of dies;
- a pair of projection optical systems, a first of which forms a first image of the irradiated light for exposure transmitted through said 1800 phase shift means and projects the formed first image, and a second of which forms a second image of the irradiated light having passed through a second die of the pair of dies and projects the formed second image;
- means for forming a superposed image of the first image and the second image;
- and
- a detection section for detecting defects on the phase shift mask by processing the superposed image.
A defect inspection system for phase shift masks comprising:
- a source of monochromatic light source for irradiating light perpendicularly onto a surface of a phase shift mask to be examined, the mask having a pair of dies that are identical except for possible flaws;
- a pair of projection optical systems each of which forms an image pattern of the irradiated light having passed through a corresponding one of the dies and which projects the formed image pattern;
- means for forming a superposed image of the image patterns formed by the pair of projection optical systems;
- and
- a detection section for detecting defects on the phase shift mask to be examined by processing the superposed image.
A defect inspection system for phase shift masks comprising:
- a monochromatic light source for irradiating light perpendicularly onto the surface of a phase shift mask to be examined, the mask having a pair of dies that are identical except for possible flaws;
- a 180.degree. phase shift means disposed on an optical path of the irradiated light after a first of the pair of dies;
- a pair of projection optical systems, a first of which forms a first image of the irradiated light for exposure transmitted through said 180.degree. phase shift means and projects the formed first image, and a second of which forms a second image of the irradiated light having passed through a second die of the pair of dies and projects the formed second image;
- means for forming a superposed image of the first image and the second image;
- and
- a detection section for detecting defects on the phase shift mask by processing the superposed image.
Dependencies are inferred from the claim text.