Device for detecting X-rays
AssigneeOlympus Optical Co., Ltd.
InventorsYoshiaki Horikawa, Yoshinori Iketaki, Shoichiro Mochimaru, Koumei Nagai
Life of this patent
Estimating the term…
Loading patent…
AssigneeOlympus Optical Co., Ltd.
InventorsYoshiaki Horikawa, Yoshinori Iketaki, Shoichiro Mochimaru, Koumei Nagai
Estimating the term…
A soft X-ray detector includes a surface electrode layer, a photoelectric conversion layer, and a semiconductor detector having an electrode connected to the photoelectric conversion layer, for detecting an electric charge produced In the photoelectric conversion layer. The photoelectric conversion layer and the surface electrode layer have thicknesses satisfying conditions dA.gtoreq.0.183.lambda./KA dB.ltoreq.0.183.lambda./KB where dA is a thickness of the photoelectric conversion layer, dB is a thickness of the surface electrode layer, KA is an extinction coefficient of radiation of a wavelength .lambda. in a substance constituting the photoelectric conversion layer, and KB is an extinction coefficient of radiation of the wavelength .lambda.in a substance constituting the surface electrode layer. Thus, the soft X-ray detector has a high sensitivity to soft X rays and a lower sensitivity to visible light, so that only soft X rays can be selectively detected. Further, the detector has two kinds of pixels, with one kind sensitive to soft X-rays and the other kind sensitive to visible light. In addition, the detector includes a plurality of pixels, to which the surface electrode layer is divided to correspond so that it has a plurality of regions to obtain a desired wavelength.
An X-ray detector comprising:
An X-ray detector comprising:
A soft X-ray detector comprising:
A soft X-ray detector comprising:
A soft X-ray detector comprising:
A soft X-ray detector comprising:
Dependencies are inferred from the claim text.