Memory with on-chip detection of bit line leaks
AssigneeSGS-Thomson Microelectronics S.A.
InventorOlivier Rouy
Life of this patent
Estimating the term…
Abstract
A circuit for the detection of current leaks on a bit line of a memory (such as an EPROM or flash EPROM), which includes a current generator and circuitry for applying zero volts to the gates of all the cells f the bit line. The detection information is delivered by a comparison circuit. It corresponds to the result of the comparison between the test current and the current flowing in the bit line. Advantageously, the detection circuit is incorporated into the read circuit of the memory. Also disclosed is an associated detection method, and a memory circuit which includes such a detection circuit.
Claims16
An integrated circuit, comprising:
- an array of memory cells organized in rows and columns, wherein each said cell includes a floating gate transistor;
- address decode logic, connected to access a selected one of said rows of cells, and to connect a selected column for sensing, in accordance with an externally received address;
- a sense amplifier, connected to differentially compare the current drawn on said selected column, by a cell in said selected row, with the current supplied by a read reference current source;
- a leakage-detect current source, connected to supply a leakage reference current which is less than the current supplied by said read reference current source;
- and
- test logic, configured and connected to differentially compare said leakage reference current with, for each successive column, the current drawn on said each successive column while no rows are selected.
An integrated circuit, comprising:
- an array of memory cells organized in rows and columns, wherein each said cell includes a floating gate transistor;
- address decode logic, connected to access a selected one of said rows of cells, and to connect a selected column for sensing, in accordance with an externally received address;
- a leakage-detect current source, connected to supply a leakage reference current which is less than the current supplied by a read reference current source;
- and
- a sense amplifier configured to perform differential current comparison;
- wherein, during a normal read operation, said sense amplifier is connected to differentially compare the current drawn on a selected column with the current supplied by said read reference current source;
- and wherein, during test mode, said sense amplifier is connected to differentially compare the current drawn on a selected column with the current supplied by said leakage-detect current source.
An integrated circuit, comprising:
- an array of memory cells organized in rows and columns, wherein each said cell includes a floating gate transistor;
- address decode logic, connected to access a selected one of said rows of cells, and to connect a selected column for sensing, in accordance with an externally received address;
- a read reference current source, comprising at least one unprogrammed floating gate transistor;
- a leakage-detect current source, connected to be activated, in test mode, to supply a leakage reference current which is less than the current supplied by said read reference current source;
- and
- a sense amplifier configured to perform differential current comparison;
- wherein, during a normal read operation, said sense amplifier is connected to differentially compare the current drawn on a selected column with the current supplied by said read reference current source;
- and wherein, during said test mode, said sense amplifier is connected to differentially compare the current drawn on a selected column with the current supplied by said leakage-detect current source.
Dependencies are inferred from the claim text.