Non-volatile semiconductor memory device equipped with high-speed sense amplifier unit
AssigneeNEC Corporation
InventorKiyokazu Hashimoto
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AssigneeNEC Corporation
InventorKiyokazu Hashimoto
Estimating the term…
An electrically erasable and programmable read only memory device has a sense amplifier circuit for changing an output voltage level at the output node thereof indicative of either an erased or a write-in state of a memory cell to be accessed, and the output voltage level is compared with a reference voltage level so as to see whether the output voltage is indicative of the erased state or the write-in state, wherein the sense amplifier circuit is associated with a current make-up circuit for compensating the current to the output node of the sense amplifier circuit so that the output voltage level rapidly reaches a high or low voltage level regardless of fluctuation of the reference voltage level.
A non-volatile semiconductor memory device fabricated on a single semiconductor chip, comprising:
A non-volatile semiconductor memory device fabricated on a single semiconductor chip, comprising:
Dependencies are inferred from the claim text.