Semiconductor integrated circuit device having circuit inspection function

A semiconductor integrated circuit device having a circuit delay time inspection function, comprising:

• a first latch circuit, having a timing input, for latching an address signal;
• a memory circuit for outputting data accessed on receiving said address signal from said first latch circuit;
• a second latch circuit, having a timing input, for latching an output from said memory circuit;
• and
• a ring oscillator connected between the timing inputs of said first and second latch circuits, and containing a variable delay circuit in a loop thereof:
• wherein a delay output of said delay circuit is connected as a latch timing signal to said second latch circuit.

A semiconductor integrated circuit device comprising:

• latch circuits disposed as pre-and post-stage circuits for a to-be-inspected circuit inside said semiconductor integrated circuit device;
• and
• a variable delay circuit capable of changing a delay time in accordance with an instruction given by outside;
• wherein a first timing signal applied to said pre-stage latch circuit is delayed by said variable delay circuit and the delayed timing signal is inputted to said post-stage latch circuit so that a delay time of said to-be-inspected circuit can be inspected, an output signal of said variable delay circuit is fed back to an input terminal of said variable delay circuit through selection circuits in such a manner as to form an oscillation circuit, and an oscillation signal of said oscillation circuit can be outputted outside said semiconductor integrated circuit device.