Optical measurement system for determination of an object's profile or thickness

An optical measurement method for determination of a profile or thickness of an object, said method using:

• a first optical head including light projector means directing a first light beam to a first point on a surface of the object and including photo-sensor means receiving a reflected light from said first point on the surface and providing a first output which varies in proportion to a perpendicular distance from a reference plane to said first point on the object's surface;
• a second optical head including light projector means directing a second light beam to a second point on a surface of the object and including photo-sensor means receiving a reflected light from said second point on the surface and providing a second output which varies in proportion to a perpendicular distance from a reference plane to said second point on the object's surface;
• and
• a single processing circuit capable of processing said first and second outputs to measure by triangulation the perpendicular distances of said first and second points respectively from said reference plane and analyzing a surface or thickness of the object based upon thus measured perpendicular distances,
• said method comprising delivering said first output from said first optical head to said processing circuit for determination of said perpendicular distance and then delivering said second output from said second optical head to said common processing circuit for determination of said perpendicular distance, thereby enabling said processing circuity to analyze the surface or thickness of said object from the individual perpendicular distances.