MBE process for preparing oxide superconducting films
AssigneeSumitomo Electric Industries, Ltd.
InventorsKeizo Harada, Hideo Itozaki, Shuji Yazu
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AssigneeSumitomo Electric Industries, Ltd.
InventorsKeizo Harada, Hideo Itozaki, Shuji Yazu
Estimating the term…
In a process for preparing a thin film of oxide superconductor having a layered crystal structure by depositing each layer of said layered crystal structure on a substrate by Molecular Beam Epitaxy (MBE) method with introducing oxygen-containing gas which is excited by irradiation of microwave, improvement in that a film-forming operation by the MBE method is interrupted temporarily after predetermined numbers of constituent layers which correspond to one unit crystal or less than one unit crystal are layered so that the deposited constituent layers are left in an activated oxygen atmosphere to effect a crystallization promotive operation, before the next film-forming operation is restarted.
A process for preparing a film of oxide superconductor having a layered crystal structure by depositing constituent layers of said layered crystal structure on a substrate successively by molecular beam epitaxy (MBE) method while an oxygen-containing gas which is excited by irradiation of microwave is introduced in the neighborhood of a surface of the substrate, comprising the steps of depositing preselected numbers of constituent layers which correspond to one unit crystal or less than one unit crystal, interrupting the film-forming operation by the MBE method temporarily, maintaining the deposited constituent layers in an activated oxygen atmosphere in order to effect a crystallization promotive operation and then restarting a next film-forming operation by the MBE method after completion of said crystallization promotive operation which is terminated when a desired pattern is observed in a reflection high energy electron diffraction (RHEED) analyzer, a combination of said film-forming operation and said crystallization promotive operation being repeated for desired times until a desired film thickness is obtained.
Dependencies are inferred from the claim text.