Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide
AssigneeTopcon Corporation
InventorsNicolas Gisin, Patrick Stamp, Rogerio Passy, Nobuo Hori, Shigenori Nagano
Life of this patent
Estimating the term…
Abstract
An optical waveguide portion is provided on one surface of a substrate portion. A luminous flux for measurement is caused to be incident on one end face of the optical waveguide substrate, and only leaking light having passed through the substrate portion is received. The cross-sectional distribution of the refractive index of the optical waveguide portion is measured from changes in the received quantity of light.
Claims6
An apparatus for measuring the cross-sectional distribution of the refractive index of an optical waveguide, comprising a projector system for causing a luminous flux for measurement to be incident on one end of an optical waveguide portion provided on one surface of a substrate portion and a light-receiving unit for receiving leaking light of said luminous flux for measurement from said optical waveguide portion, characterized in that said light-receiving unit is arranged at the other end of said optical waveguide portion such as to receive only leaking light having passed through said substrate portion, wherein the cross-sectional distribution of the refractive index of said optical waveguide portion is measured from changes in the amount of light incident on said light-receiving unit.
Dependencies are inferred from the claim text.