Method and apparatus for testing integrated circuits

A method for testing an integrated circuit in a testing apparatus after a departure of the integrated circuit from an integrated circuit singulation apparatus comprising the steps of:

• a) moving the testing apparatus to a loading position;
• b) loading the integrated circuit into the testing apparatus;
• c) moving the testing apparatus to a test position to position the integrated circuit for testing;
• d) performing electrical tests on the integrated circuit to provide a tested integrated circuit having identified first and second test conditions;
• e) moving the testing apparatus from the test position to position the tested integrated circuit for unloading;
• f) moving the tested integrated circuit to a first unloading position;
• g) unloading the tested integrated circuit from the first unloading position to a first track when it has said first test condition;
• h) moving the tested integrated circuit to a second unloading position when it has said second test condition;
• and
• i) unloading the tested integrated circuit from the second unloading position to a second track when it has said second test condition.

A testing apparatus for controlling positioning of a circuit before, during and after a circuit test is performed on the circuit, the circuit test determining first and a second test condition of the circuit, the apparatus comprising:

• a) a positioning apparatus having a first port and a second port and capable of displacement to a first position and a second position, said first port receiving the circuit for testing;
• b) a testing apparatus for securing said circuit during a testing of the circuit, said positioning apparatus displaced to said second position during the testing;
• c) a testing control pin for retaining said circuit in said first port prior to the testing and for allowing a transfer of said circuit from said first port to said second port subsequent to the testing;
• d) a first track for receiving said circuit from said second port when said circuit test finds said circuit to have the first test condition, said positioning apparatus being in said first position;
• and
• e) a second track for receiving said circuit from said second port when said circuit test finds said circuit to have the second test condition, said positioning apparatus being in said second position.