Circuit arrangement for converting a voltage drop tapped from a test object from a predetermined input voltage range to a desired output voltage range

A circuit for converting a voltage drop tapped from a test object from a predetermined input voltage range to a desired output voltage range, said circuit comprising:

• a current mirror circuit having an input transistor and an output transistor;
• a first constant current source connected to the input of said current mirror circuit via said input transistor for providing a constant current thereto;
• a first diode connected to the output of said current mirror circuit via said output transistor for receiving a current therefrom of equal magnitude to the current provided by said first constant current source to the input of said current mirror circuit;
• said first diode and the output transistor of said current mirror circuit defining a first circuit branch;
• a second circuit branch of identical configuration to the first circuit branch and lying parallel thereto, said second circuit branch including a third transistor and a second diode connected to the output of said third transistor;
• a second constant current source connected to the input of said third transistor for providing a test current thereto;
• a supply voltage terminal connected to said current mirror circuit;
• the test object being adapted to be connected to the supply voltage terminal and between said second constant current source and the input of said third transistor to be traversed by the test current from said second constant current source;
• a first output terminal connected between the output of said current mirror circuit and said first diode;
• and
• a second output terminal connected between the output of said third transistor and said second diode whereby a converted voltage drop is obtainable from said first and second output terminals in relation to the voltage drop as tapped from the test object.