Measuring probe
AssigneeRenishaw Metrology Limited
InventorsDavid R. McMurtry, David A. Wright, Stephen E. Lummes
Life of this patent
Estimating the term…
Abstract
A measuring probe comprises a stylus-carrying member on which a stylus is magnetically retained. The carrying member is supported on a flat diaphragm spring for tilting movement relative to an intermediate member. The intermediate member is supported on two further diaphragms for linear movement relative to a housing. The spring rates of diaphragm and further diaphragms are chosen to give the probe the desired relative force/displacement characteristics in X,Y and Z.
Claims13
A measuring probe for use on a coordinate positioning apparatus, the probe comprising:
- a fixed structure by which the probe may be supported on a movable arm of the machine, and a stylus retaining member for retaining a workpiece-contacting stylus supported relative to the fixed structure by a suspension mechanism permitting at least two dimensional movement of the retaining member relative to the fixed structure, the probe further comprising transducer means for measuring displacement of the stylus retaining member in three perpendicular directions relative to the fixed structure, the transducer means comprising:
- three light sources for generating three beams of light extending in three different directions;
- three photodetectors retained on the fixed structure, each photodetector lying in register with one of the light beams;
- a shutter coupled to the stylus retaining member for movement relative to the fixed structure which corresponds to movement of the stylus retaining member relative to the fixed structure, said shutter located in the path of each of said three light beams and including three apertures each of which permits the passage of a fraction of one of said light beams onto the surface of the corresponding photodetector;
- each of said three photodetectors emitting at least one signal which is indicative of the displacement in a given direction of the position of incidence of said fraction of said respective light beam on said detector;
- wherein:
- said three apertures are provided by three mutually perpendicular slits each of which a) extends in a direction transverse to said given direction and b) defines a direction of movement of said retaining member to which the corresponding photodetector is insensitive.
A probe for use on a coordinate positioning apparatus, the probe comprising:
- a fixed structure by which the probe may be supported on a movable arm of the machine, and a stylus retaining member for retaining a workpiece-contacting stylus supported relative to the fixed structure by a suspension mechanism permitting at least two dimensional movement of the retaining member relative to the fixed structure, the probe further comprising a transducer assembly that measures displacement of the stylus retaining member relative to the fixed structure from a null position, the assembly comprising:
- a light source for generating a beam of light;
- a photodetector retained on the fixed structure and lying in register with the beam of light;
- a shutter coupled to the stylus retaining member for movement relative to the fixed structure which corresponds to movement of the stylus retaining member relative to the fixed structure, said shutter being positioned between the light source and the photodetector, said shutter including an elongated slit aperture that permits the passage of a fraction of said light beam onto the surface of the photodetector,said elongated slit aperture extending in a first direction;
- said photodetector emitting at least one signal that is indicative of displacement in a second direction transverse to said first direction of a position of incidence of said fraction of said light beam passing through said elongated slit onto said photodetector.
Dependencies are inferred from the claim text.