Method for measuring the temperature of a material by using microwave radiation
AssigneeCentre National De La Recherche Scientifique
InventorsJean-Claude Van De Velde, Eugene Constant
Life of this patent
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AssigneeCentre National De La Recherche Scientifique
InventorsJean-Claude Van De Velde, Eugene Constant
Estimating the term…
The invention relates to a method and a device for measuring the temperature T.sub.x of any material or object, by using a microwave radiation, as well as to an application of said method for determining the coefficient of hyperfrequency reflection of any material or object. According to the method, the microwave radiation emitted through an antenna (1) is captured and the signals received are directed towards signal processing means (3). Additionally, between the antenna (1) and said means (3), a given impedance line (4) is intercalated whose impedance is a function of the input impedance of said means (3), and with a length L much bigger than the wave length of processed signals, so that the correlation factor of said means (3) is negligible. Furthermore, the output voltage is processed by calculation of all parameters by cylindrically modifying the structure of said processing means (3).
A process for measuring the temperature T.sub.x of a given material or object, using microwave frequency radiation, comprising the steps of:
A device for measuring the temperature T.sub.x of a given material or object, using microwave radiation, comprising:
A process for measuring the temperature T.sub.x of a given material or object, using microwave frequency radiation, comprising the steps of:
A device for measuring the temperature T.sub.x of a given material or object, using microwave radiation, comprising:
Dependencies are inferred from the claim text.