Semiconductor device of tab structure, capable of ensuring ease of testing of same in final form
AssigneeKabushiki Kaisha Toshiba
InventorShinobu Wada
Life of this patent
Estimating the term…
Abstract
A semiconductor device comprises a tape member, an IC chip mounted on the tape member, a plurality of leads arranged on the tape member each having one end connected to the IC chip and the other end provided with an area to be used for testing the IC chip and an insulation member for covering said plurality of leads except the one ends and the areas to be used for testing the IC chip, the tape member being provided with one or more one openings that reach the plurality of leads. With such an arrangement, the plurality of leads can be easily accessed and brought into contact with probes for testing the IC chip.
Claims6
A semiconductor device comprising:
- a tape member having first and second faces, at a center of which a hole is formed;
- a plurality of leads having first and second ends and mounted on the first face of said tape member so that the first ends project over said hole;
- a slit formed in a portion of said tape member around the hole, said slit being located below portions of said leads which are proximate to the first ends, said slit exposing said leads to permit contact with a probe;
- a semiconductor chip arranged in aid hole and in contact with the first ends;
- a first insulation member located in said hole, for covering at least a contact portion where said semiconductor chip and the first ends are in contact with one another;
- and
- a second insulation member formed on said leads and said slit, for covering said leads except for the second ends thereof.
A semiconductor device comprising:
- a tape member having first and second faces, at a center of which a first hole is formed;
- a plurality of leads having first and second ends and mounted on the first face of said tape member so that the first ends project over the first hole;
- a plurality of second holes arranged in a plurality of lines in a staggered manner, the second holes being formed in a portion of said tape member around the first hole, said second holes being located below portions of said leads which are proximate to the first ends, said second holes exposing said leads to permit contact with a probe;
- a semiconductor chip arranged in the first hole and in contact with the first ends;
- a first insulation member located in the first hole, for covering at least a contact portion where said semiconductor chip and the first ends are in contact with one another;
- and
- a second insulation member formed on said leads and said second holes, for covering said leads except for the second ends thereof.
Dependencies are inferred from the claim text.