Compact specimen inspection station
AssigneeKensington Laboratories, Inc.
InventorsPaul E. Bacchi, Paul S. Filipski
Life of this patent
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AssigneeKensington Laboratories, Inc.
InventorsPaul E. Bacchi, Paul S. Filipski
Estimating the term…
The present invention is a compact specimen inspection station (10) that processes vertically oriented specimens. Specimen storage, transport, and inspection components (26,28, and 30) are all mounted to a vibration-damped support structure (14) and are designed to handle specimens (34) positioned with a generally vertical orientation. The station is designed to minimize undesirable specimen motion and contamination caused by an operator (42). The station is also equipped with a microscope (32) and a display monitor (36) that provide a real image and a video image, respectively, of a microscopic region of the specimen under inspection. The station is equipped with failsafe mechanisms (176 and 182) that prevent the dropping of a specimen during an electrical power failure or a vacuum pressure loss.
A specimen inspection station, comprising:
A specimen inspection station, comprising:
A specimen inspection station, comprising:
The station of claim 11 in which the vacuum pressure source additionally communicates with the specimen transporter and includes an accumulator capable of maintaining vacuum pressure to the state and the specimen transporter to allow the specimen transporter to store the specimen in the event of a decrease in vacuum pressure.
A method for inspecting a specimen comprising the steps of:
A method for inspecting a specimen comprising the steps of:
A specimen inspection station, comprising:
Dependencies are inferred from the claim text.