Electrical measurement of sidewall angle
AssigneeAdvanced Micro Devices, Inc.
InventorsMichael K. Templeton, Subhash Gupta
Life of this patent
Estimating the term…
Abstract
A method for measuring the sidewall angle of patterned photoresist (16), as well as wall angles of other materials, is provided. The method comprises forming two copies of the patterned photoresist feature for which the sidewall measurement is to be obtained on a conducting substrate (14). The first copy is processed via conventional techniques for linewidth measurement, which consists of a pattern transfer etch of the first copy into the underlying conductive substrate, followed by electrical measurement of the conductor linewidth to yield linewidth 1 (LW1). The second copy is processed such that there is a shape altering etch prior to the pattern transfer etch. A linewidth 2 (LW2) is obtained. The angle is then extracted from the two linewidth measurements.
Claims10
A method for determining the sidewall angle of a structure supported on a surface of a substrate, comprising:
- (a) forming an etchable conducting layer over said surface of said substrate;
- (b) forming said structure on said etchable conducting layer;
- (c) measuring a first linewidth on a first portion of said etchable conducting layer by a process comprising
- (1) forming a patterned layer of lines having a given width in said structure on said conducting layer, leaving exposed portions thereof,
- (2) performing a pattern transfer etch by removing said exposed portions to leave patterned areas in said conducting layer which replicate said patterned layer and which have a first linewidth equal to said given width, and
- (3) electrically measuring said first linewidth;
- (d) measuring a second linewidth on a second portion of said etchable conducting layer by a process comprising
- (1) forming a patterned layer of lines having a given width on said conducting layer, leaving exposed portions thereof,
- (2) performing a shape-altering etch that alters the shape of said patterned layer,
- (3) performing a pattern transfer etch by removing said exposed portions to leave patterned areas in said conducting layer which replicate said patterned layer and which have a second linewidth equal to said given width, and
- (4) electrically measuring said second linewidth;
- and
- (e) calculating said sidewall angle by comparing said second linewidth to said first linewidth.
A method for determining the sidewall angle of a structure comprising a patternable material on a surface of a semiconductor substrate, comprising:
- (a) forming an etchable conducting layer over said surface of said substrate;
- (b) forming said structure on said etchable conducting layer;
- (c) measuring a first linewidth on a first portion of said etchable conducting layer by a process comprising
- (1) forming a patterned layer of lines having a given width on said conducting layer, leaving exposed portions thereof,
- (2) performing a pattern transfer etch by removing said exposed portions to leave patterned areas in said conducting layer which replicate said patterned layer and which have a first linewidth equal to said given width, and
- (3) electrically measuring said first linewidth;
- (b) measuring a second linewidth on a second portion of said etchable conducting layer by a process comprising
- (1) forming a patterned layer of lines having a given width on said conducting layer, leaving exposed portions thereof,
- (2) performing a shape-altering etch that alters the shape of said patterned layer, said shape-altering process comprising a surface image transfer etch, employing a plasma ion etch, in which the etching rate of said structure is greatly increased for any surface that is not at normal incidence to the trajectory of plasma ions bombarding the etched surface,
- (3) performing a pattern transfer etch by removing said exposed portions to leave patterned areas in said conducting layer which replicate said patterned layer and which have a second linewidth equal to said given width, and
- (4) electrically measuring said second linewidth;
- and
- (c) calculating said sidewall angle by the equation
- .theta..sub.r =Arctan(T.sub.r /.DELTA.)
- where .theta..sub.r is the resist sidewall angle, T.sub.r is the initial resist thickness before the surface image transfer etch process, and .DELTA.=(LW1-LW2)/2, where LW1 is said first linewidth and LW2 is said second linewidth.
Dependencies are inferred from the claim text.