Plasma CVD system comprising plural upper electrodes
AssigneeKawasaki Steel Corporation
InventorsNobuyoshi Sato, Kojiro Sugane
Life of this patent
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Abstract
A diode parallel-plate plasma CVD system has semiconductor wafers are mounted with each of the front surfaces thereof being downwardly directed. The plasma CVD system includes an insulating wafer holder and conductive upper electrodes each being adapted to cover back surface of the semiconductor wafer, thereby forming a film to reduce internal stress and improve energy efficiency.
Claims7
A diode parallel-plate plasma CVD system, wherein a plurality of semiconductor wafers, each with front and back surfaces, are mounted with said front surface of each semiconductor wafer having formed thereon an integral circuit, comprising:
- an insulating wafer holder having a plurality of openings, each opening having a peripheral portion on which one of said semiconductor wafers is mounted such that the front surface of said semiconductor wafer is exposed;
- and
- a plurality of conductive upper electrodes facing the back surfaces of the semiconductor wafers, each upper electrode being located only in a region of a corresponding one of said semiconductor wafers mounted on each of said openings of said insulating wafer holder to form a plasma only in the region of the semiconductor wafers.
A diode parallel-plate plasma CVD system, wherein a plurality of semiconductor wafers, each with front and back surfaces, are mounted with each of the front surfaces having formed thereon an integral circuit, comprising:
- an insulating wafer holder having a plurality of openings, each opening having a peripheral conductive portion on which a peripheral portion of each semiconductor wafer is mounted such that the front surface of said semiconductor wafer is exposed, and
- a plurality of conductive upper electrodes facing the back surfaces of the semiconductor wafers, each upper electrode being located only in a region of a corresponding back surface of each semiconductor wafer mounted on each of said openings of said insulating wafer holder to form a plasma only in the region of the semiconductor wafers.
Dependencies are inferred from the claim text.