Method for predicting capacitance of connection nets on an integrated circuit
AssigneeVLSI Technology, Inc.
InventorsMark R. Hartoog, Robert D. Shur
Life of this patent
Estimating the term…
Abstract
A method estimates the interconnect capacitance of a first net in an integrated circuit. The first step of the method includes the generation of a value which indicates how tightly connected to one another are components connected to the first net. The second step of the method includes the prediction of interconnect capacitance of the first net based on the value generated in the first step and a number representing how many components are connected to the first net.
Claims11
A method for use in producing an integrated circuit, the method comprising the steps of:
- (a) placing components and connection nets to form the integrated circuit;
- and,
- (b) estimating the interconnect capacitance of a first net in the integrated circuit, including the substeps of
- (b.1) generating a value which indicates how tightly connected to one another are components connected to the first net, and
- (b.2) predicting interconnect capacitance of the first net based on the value generated in step (b.1) and a number representing how many components are connected to the first net.
A method for use in producing an integrated circuit, the method comprising the steps of:
- (a) placing components and connection nets to form the integrated circuit;
- and,
- (b) estimating the interconnect capacitance of a first net in the integrated circuit, including the substeps of
- (b.1) generating a value which indicates how tightly connected to one another are components connected to the first net, including the following substeps:
- (b.1.1) for each component connected to the first net, ascertaining a number of components that can be reached without traversing the first net and by traversing no more than a preselected maximum number of nets in the integrated circuit,
- (b.1.2) detecting a total number of components in a union of all components that can be reached from a component connected to the first net without traversing the first net and by traversing no more than a preselected maximum number of nets in the integrated circuit, and
- (b.1.3) setting the value equal to the ratio of a sum of all the numbers ascertained in substep (b.1.1) to the total number calculated in substep (b.1.2), and
- (b.2) using the value generated in substep (b.1) to predict interconnect capacitance of the first net.
A method for use in producing an integrated circuit, the method comprising the steps of:
- (a) placing components and connection nets to form the integrated circuit;
- and,
- (b) estimating the interconnect capacitance of a first net in the integrated circuit, including the substeps of
- (b.1) generating a value which indicates how tightly connected to one another are components connected to the first net, including the following substeps:
- (b.1.1) for each component connected to the first net, determine a fewest number of nets that need to be traversed to reach another component connected to the first net without traversing the first net, and
- (b.1.2) setting the value equal to one plus, for each component connected to the first net, an inverse of the fewest number determined in substep, and
- (b.2) using the value generated in substep (b.1) to predict interconnect capacitance of the first net.
Dependencies are inferred from the claim text.