Solid-state CCD imaging device with transfer gap voltage controller
AssigneeKabushiki Kaisha Toshiba
InventorsShinji Ohsawa, Yoshiyuki Matsunaga, Ryohei Miyagawa
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AssigneeKabushiki Kaisha Toshiba
InventorsShinji Ohsawa, Yoshiyuki Matsunaga, Ryohei Miyagawa
Estimating the term…
A solid-state CCD imaging device has a substrate, photosensitive pixel cells provided as pixel sections in the substrate, and a transfer section, provided in the substrate, for transferring signal charge carriers read out from the pixel cells in a predetermined transfer direction. The transfer section has a semiconductive charge transfer channel layer formed in the substrate and transfer electrodes insulatively provided above the substrate and arrayed in the above direction while predetermined gap sections are kept therebetween. Each of the transfer electrodes defines one charge transfer stage. A gap potential control electrode layer is insulatively disposed above the electrodes. The gap potential control electrode layer is applied with a gap potential control voltage and steadily sets, in accordance with the applied voltage, the potential in layer sections of the channel layer located below the gap section of the transfer electrodes at a predetermined level intermediate between "High" and "Low" level voltages of the channel layers upon charge transfer.
A solid-state imaging device comprising:
A solid-state charge transfer device comprising:
A solid-state imaging device comprising:
Dependencies are inferred from the claim text.