System for loading semiconductor package tester
AssigneeVLSI Technology, Inc.
InventorLawrence E. Spanton
Life of this patent
Estimating the term…
Abstract
An apparatus for loading devices into a semiconductor tester is disclosed. The tester has an input track for accepting devices. The apparatus includes a number of elongated tracks for holding a plurality of semiconductor devices. Each elongated track has at its input end a stop hinge for connection to a tube for holding the semiconductor devices. Each elongated track has at its output end a gate for controlling the release of devices onto the input track of the tester from the elongated track. A control circuit controls the operation of the gates so that the devices can be loaded from the elongated tracks onto the input track of the tester sequentially.
Claims13
An apparatus for use with a semiconductor tester which inspects a plurality of devices, said tester having an input track for accepting the devices, said apparatus loading devices onto the input track, said apparatus comprising:
- a plurality of elongated holding tracks being adapted to hold a plurality of semiconductor devices along said tracks, said plurality of semiconductor devices being contained in a plurality of tubes, with each tube adjacent to and aligned with one of said plurality of elongated holding tracks, said holding tracks including stop hinges, said stop hinges connecting and securing said tubes to said tracks;
- means for loading said devices onto said holding tracks;
- means for depositing the devices from the holding tracks onto the input track of the tester;
- and
- control means for controlling said depositing means to permit the devices to move from said elongated holding tracks onto the input track of the tester.
An apparatus for use with a semiconductor tester which inspects a plurality of devices, said tester having an input track for accepting the devices, said apparatus loading devices onto the input track, said apparatus comprising:
- a plurality of elongated holding tracks being adapted to hold a plurality of semiconductor devices along said tracks;
- means for loading said devices onto said holding tracks;
- means for depositing the devices from the holding tracks onto the input track of the tester;
- and
- control means for controlling said depositing means to permit the devices to move from said elongated holding tracks onto the input track of the tester, and wherein said control means causes said devices loaded onto the plurality of holding tracks to be deposited from one holding track at a time onto the input track and wherein said depositing means comprising a plurality of gates, each gate controlling the release of devices onto the input track from a holding track.
An apparatus for use with a semiconductor tester which inspects a plurality of devices, said tester having an input track for accepting the devices, said apparatus loading devices onto the input track, said apparatus comprising:
- a plurality of elongated holding tracks being adapted to hold a plurality of semiconductor devices along said tracks;
- means for loading said devices onto said holding tracks;
- means for depositing the devices from the holding tracks onto the input track of the tester;
- and
- control means for controlling said depositing means to permit the devices to move from said elongated holding tracks onto the input track of the tester, said depositing means further comprising a plurality of hinged tracks, each of said hinged tracks connected and corresponding to one of said elongated tracks, the position of said hinged tracks being adjustable such that each of said hinged tracks is alignable with the input track of the semiconductor tester to permit devices to pass thereon.
Dependencies are inferred from the claim text.