Method of manufacturing semiconductor device

A method of manufacturing a semiconductor device comprising the steps of:

• preparing a semiconductor substrate having a major surface with a diffusion layer formed at said major surface;
• forming an interlayer insulating film on said major surface of said semiconductor substrate, said interlayer insulating film having an upper surface;
• opening a contact hole in said interlayer insulating film, said opening extending from said upper surface of said interlayer insulating film to said major surface of said semiconductor substrate to expose a part of said diffusion layer, said contact hole having an inside wall surrounding said contact hole;
• depositing a doped polycrystalline silicon film, while supplying phosphorus thereinto, said doped polycrystalline silicon film being deposited onto said upper surface of said interlayer insulating film, onto said inside wall of said contact hole, and onto said exposed part of said diffusion layer within said contact hole, the thickness of said doped polycrystalline silicon film being thin enough so that a said doped polycrystalline silicon film forms a concavity within and above said contact hole;
• depositing a nondoped polycrystalline silicon film on said doped polycrystalline silicon film within and above said contact hole, said nondoped polycrystalline silicon film running over said concavity and over said doped polycrystalline silicon film above said upper surface of said interlayer insulating film;
• etching away said nondoped polycrystalline silicon film by a reactive ion etching method with a sulfur hexafluoride gas, said etching continuing until it just exposes said doped polycrystalline silicon film above said upper surface of said interlayer insulation film and leaves said nondoped polycrystalline silicon film in only said concavity;
• and
• further etching said doped polycrystalline silicon film and said nondoped polycrystalline silicon film simultaneously by a reactive ion etching method using a carbon fluoride gas, said further etching continuing until said upper surface of said interlayer insulating film is just exposed and the upper surface of said doped polycrystalline silicon film and said nondoped polycrystalline silicon film left in said contact hole is coplanar with said upper surface of said interlayer insulating film.