LDD MOSFET with particularly shaped gate electrode immune to hot electron effect

A field effect type semiconductor device comprising:

• a semiconductor substrate of a first conductivity type having a major surface;
• an insulating film formed on said major surface of said semiconductor substrate;
• a layer formed of only conductive materials formed on said insulating film and having sidewall portions and a crosssectional shape having an upper side and a lower side longer than the upper side;
• first diffusion layers of a second conductivity type formed on said major surface of said semiconductor substrate below said sidewall portions of said layer of conductive materials;
• second diffusion layers formed on said major surface of said semiconductor substrate adjacent both sides of said layer of conductive materials and extending beneath said layer of conductive materials such that respective one ends of said second diffusion layers overlap said sidewall portions of said layer of conductive materials and do not extend beyond said first diffusion layers;
• and
• sidewall insulating films formed on the entire sidewall portions of said layer of conductive material;
• wherein the impurity concentration of said second diffusion layers is higher than that of said first diffusion layers and the depth of the first diffusion layers is not greater than the depth of the second diffusion layers and wherein
• said layer of conductive materials includes a lower portion having a trapezoidal cross-sectional shape and an upper portion having a rectangular cross-sectional shape, and each of the sidewall portions of said lower portion includes at least a portion having a sufficient thickness to transmit impurities to be implanted;
• and
• said respective ends of said first diffusion layers extend to a substrate portion below the portion having said thickness in said lower portion of said layer of conductive materials.