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US 5,175,491 AGranted
Integrated circuit testing fixture
AssigneeSGS-Thomson Microelectronics S.A.
InventorCharles R. Ewers
Life of this patent
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Abstract
A test fixture is provided for simultaneously performing burn-in and testing of multiple integrated circuit devices. The packaged integrated circuits rest on electrical contacts without sockets. A top plate of the fixture holds all of the devices in place. The use of a compressible material allows for variations in package size, lead length, and socket wear while still maintaining good electrical connection. Leads are connected through the test substrate to the backside and the devices may be connected in parallel or otherwise as desired.
Claims6
An integrated circuit test fixture, comprising:
- a substrate;
- a compressible pad layer on said substrate;
- a plurality of conductive test leads on said pad layer, wherein said leads are bent to extend through holes in said pad and said substrate;
- a non-conductive spacer over said pad layer, said spacer having a plurality of openings to accept each lead of an integrated circuit;
- and
- a fixture cover, said cover spaced to press leads of integrated circuit devices against the test leads when said cover is closed.
3 more elements
Dependencies are inferred from the claim text.