Method of enhancing the performance of a magnetron sputtering target
AssigneeMaterials Research Corporation
InventorsSteven D. Hurwitt, Arnold J. Aronson, Charles Van Nutt
Life of this patent
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AssigneeMaterials Research Corporation
InventorsSteven D. Hurwitt, Arnold J. Aronson, Charles Van Nutt
Estimating the term…
A plasma confining magnetic field is generated over the sputtering region of a sputtering target with a critical field line which determines the shape of the plasma. The critical field line is progressively flattened over the course of the life of the target as the target erodes. Preferably, the magnet is configured with poles spaced around the portion of the target below the sputtering region to provide a magnetic field that flattens as its strength decreases. A regulated power supply maintains a regulated power level that is increased as the target erodes to maintain a constant deposition rate. The voltage delivered by the power supply is maintained at or above a constant level by progressively decreasing the current to an electromagnet to progressively reduce the field strength and flatten the field. As a result of the invention, the erosion groove of the target is broadened and the number of wafers coated by the target during its life is increased.
A method of enhancing the performance of a generally concave magnetron sputtering target having at least one annular sputtering region thereon to increase the number of substrates coated from the target over the course of the life of the target as the target erodes, said method comprising the steps of:
A method of enhancing the performance of a magnetron sputtering target having at least one sputtering region thereon to increase the number of substrates coated from the target over the course of the life of the target by maintaining a broad erosion profile at the sputtering region as the target erodes, said method comprising the steps of:
A method of enhancing the performance of a generally concave magnetron sputtering target, which is formed of a single piece of sputtering material having a plurality of sputtering regions thereon, including a first sputtering region and a second sputtering region, to increase the number of substrates coated from the target over the course of the life of the target as the target erodes, said method comprising the steps of:
Dependencies are inferred from the claim text.
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Applying energy to the substrate during sputtering: using substrate bias
Sputtering: by application of a magnetic field, e.g. magnetron sputtering
Using supplementary magnetic fields: magnetron sputtering
Coating metallic material
Term ended 29 Aug 2010 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.
The present invention relates to methods for extending the use of cathode sputtering targets and more particularly to methods for controlling the energization of a cathode sputtering target over the course of its life to broaden the erosion area of the target and thereby increase the utilization of target material.
Sputter coating is a process carried out in a vacuum chamber, filled with a generally chemically inert gas, in which a substrate to be coated is mounted facing a target formed of the coating material. In the chamber, the target is subjected to an electrical potential negative with respect to the chamber wall or some other anode within the chamber. The potential gradient adjacent the target surface causes electrons to be emitted from the target. As they are attracted toward the chamber anode, the emitted electrons strike and ionize some of the atoms of the inert gas by stripping electrons from them. Positive ions of the gas are thereby formed and attracted toward the negative target which they strike, transferring momentum to the target material, and ejecting particles of the material from the target surface. The substrate to be coated, which is positioned in the chamber usually with its surface facing the target so as to intercept the moving particles of coating material sputtered from the target, receives some of the ejected particles, which adhere to and coat the substrate surface.
In magnetron enhanced sputtering processes, a magnetic field is formed over the target surface with magnetic field lines having components extending parallel to the target surface. In many applications, the field lines arch over the target surface and form a closed magnetic tunnel. The magnetic field causes the electrons moving from the target to curve in spiral paths over regions of the target surface enclosed by the field, thereby increasing the electron density in the enclosed space, and resulting in an increase in the rate of electron collisions with gas atoms over the enclosed regions of the target surface. The increased collision rate in turn increases the ionization of the gas in the enclosed space and thus increases the efficiency of the sputtering process at the underlying target region. Where the magnetic field lines equal or exceed a critical field strength over the target surface, a glowing ion cloud or plasma is seen trapped within the field over the region of the target surface.
FIG. 1 is a cross-sectional view of a processing chamber of the sputter coating apparatus embodying principles of the present invention;
FIG. 2 is a diagram illustrating an electrical circuit arrangement according to principles of the present invention;
FIG. 3 is a graph illustrating the variation of various electrical values of the circuit of FIG. 2 as a function of time over the operative life of the target; and
Magnetron sputtering devices of the type to which the present invention relates are described in the following commonly assigned U.S. patents and copending patent applications which are hereby expressly incorporated in their entirety into this application by reference:
U.S. Pat. No. 4,853,033 for "Cathode Target Design for a Sputter Coating Apparatus";
U.S. Pat. No. 4,871,433 for "Apparatus for Improving the Uniformity of Ion Bombardment In a Magnetron Sputtering System";