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US 4,902,632 AGranted
Method of preventing superficial electrical discharges in chips of semiconductor devices during testing
AssigneeSGS-Thomson Microelectronics S.A.
InventorsCarmelo Oliveri, Carmelo Magro
Life of this patent
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Abstract
The method consists of subjecting the semiconductor chips to chemical treatment with a silanizing agent immediately before testing to prevent superficial electrical discharges which can reduce the testing voltage which can be applied.
Claims2
A method of preventing the occurrence of superficial electrical discharges in the chips of semiconductor devices during testing, which comprises subjecting the chips to chemical treatment with a silanized agent immediately before testing.
Dependencies are inferred from the claim text.