Method and apparatus for improving the uniformity ion bombardment in a magnetron sputtering system
AssigneeMaterials Research Corporation
InventorsIsrael Wagner, Steven D. Hurwitt
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AssigneeMaterials Research Corporation
InventorsIsrael Wagner, Steven D. Hurwitt
Estimating the term…
A magnetron sputtering apparatus and method, in which the ion flux bombarding the substrate is made uniform. Countermagnet means are chosen and positioned such that the vertical components of the countermagnet field are of opposite direction and equal magnitude to the vertical components of the cathode magnet in the vicinity of the substrate. Thus, the cathode magnetic field lines become substantially flat in the vicinity of the substrate and do not cause the ion flux to be distributed on the substrate surface in a non-uniform manner. Measurement of ion current density on the substrate surface during operation of the invention reveals that the invention provides substantially constant flux at all points on the substrate surface.
A sputtering method for imparting a uniform secondary ion flux distribution upon a substrate, comprising the steps of:
A sputtering method for impacting a uniform ion flux upon a substrate, said method comprising the steps of:
Apparatus for sputter coating a substrate, said apparatus comprising:
Apparatus for sputter coating a substrate, said apparatus comprising:
Apparatus for sputter etching a substrate having a surface to be etched, said apparatus comprising:
Apparatus for sputtering coating a substrate, said apparatus comprising:
Dependencies are inferred from the claim text.