Method for controlling electroless magnetic plating
AssigneeMagnetic Peripherals Inc.
InventorCherng-Dean Wu
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Abstract
An improved method for controlling magnetic quality of electroless plating in which the plated substrates are subjected to magnetic film deposition for a true plating time determined by offsetting the total plating time by the activation time, the activation time being the time for surface potential transients to decrease and steady state surface potential to occur.
Claims5
An improved method for controlling an electroless plating bath to control the magnetic quality of the deposited film on a selected substrate, the method comprising the steps of:
- (a) measuring the surface potential of the plating substrate;
- (b) determining the activation time for the surface potential to increase a final steaady value;
- and
- (c) subjecting the substrate to a true plating time calculated by the formula:
- t.sub.tr equals t.sub.t less t.sub.act, where t.sub.tr is true plating time, t.sub.t is the total plating time, and t.sub.act is the activation time.
An improved method for controlling an electroless plating bath to control the magnetic quality of the deposited film on a selected substrate, the method comprising the steps of:
- plating the substrate in an electroless plating bath;
- determining the activation time for the transient potentials to decrease and for steady state surface potential to occur for the substrate being plated;
- and
- continuing the plating of the substrate for predetermined true plating time extending beyond the determined activation time.
Dependencies are inferred from the claim text.